Scanning Electron Microscope with EDX

Examination of surface topography, orientationand material contras

Brand: Carl Zeiss Mikroskopie GmbH
Model: Supra 40 VP
Resolution: 1 nm
Magnification: 10 to 900,000x
Variable pressure mode: up to 140 Pa
Secondary electron images
Backscatter electron images
Transmission electron images
Detectors: In lens, SE2, BSE, VPSE, STEM

Contact

Dr.

Barbara Güttler

Manager Material Analytics