Atomic Force Microscope (AFM)

Manufacturer: Bruker Nano GmbH

Model: Dimension IconIR

Lateral resolution: up to 2 nm (depending on the measuring tip)

x/y scan range: 300 nm to 100 µm

z-scan range: 10 µm

Max. Sample diameter: 150 mm

Max. Sample thickness: 70 mm

Heating: RT-250 °C

Measurement modes: AFM standard modes (Tapping Mode, Contact Mode, Lateral Force Microscopy, Force Volume ...), Peak Force Tapping, Peak Force QNM, nano-DMA, photothermal AFM-IR (wavenumber range: 1850-750 cm-1), nano-TA (RT-350 °C)